avatar for Dr. Yoshi Ohno

Dr. Yoshi Ohno

NIST Fellow, Sensor Science Division
Gaithersburg, MD USA

Dr. Yoshi Ohno is a NIST Fellow at Sensor Science Division of NIST in USA. He has wide range of research in photometry and colorimetry, with recent focus on measurement and color quality of solid state lighting (SSL). Specific projects of interest include integrating sphere, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting.

Ohno is very active in international standardization work, serving as President of CIE (International Commission on Illumination) for 2015-2019 term. He chairs the CIE TC2-71, which has just published CIE standard S 025 Test Method for LED lamps, luminaires and modules. He is also a Fellow of IES (Illuminating Engineering Society of North America), active also in ANSI (American National Standards Institute), and is known as the primary author of IES LM-79 (SSL test method) and ANSI C78.377 (SSL chromaticity specifications). He also led the IES working group for LM-85 (test method for high power LEDs) just published. Ohno has also been the leader of Task 2 (SSL Testing) of the International Energy Agency (IEA) 4E SSL Annex, and led the interlaboratory comparison IC 2013 for SSL products testing. He received his Ph.D. in engineering from Kyoto University, Japan. He worked at Panasonic in Osaka before he moved to NIST in 1992. He received several awards including CIE de Boer Gold Pin Award in 2007, US Department of Commerce Silver Medal Award in 2009, and U.S. Department of Energy SSL Visionary Award in 2014.

My Speakers Sessions

Saturday, October 10

9:00am EDT